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VLSI Test Principles and Architectures: Design for Testability (Hardcover)

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$89.95
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Description


This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Product Details
ISBN: 9780123705976
ISBN-10: 0123705975
Publisher: Morgan Kaufmann Publishers
Publication Date: June 1st, 2006
Pages: 808
Language: English
Series: Morgan Kaufmann Series in Systems on Silicon (Hardcover)