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VLSI Test Principles and Architectures: Design for Testability (Hardcover)
By
Laung-Terng Wang
,
Cheng-Wen Wu
,
Xiaoqing Wen
$89.95
Email or call for price
Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
Product Details
ISBN:
9780123705976
ISBN-10:
0123705975
Publisher:
Morgan Kaufmann Publishers
Publication Date:
June 1st, 2006
Pages:
808
Language:
English
Series:
Morgan Kaufmann Series in Systems on Silicon (Hardcover)
Categories
Electrical
Electronics - Circuits - VLSI & ULSI
Computer Engineering
Related Editions (all)
Paperback (July 21st, 2006): $89.95